scan design

electronics (Or "Scan-In, Scan-Out") A electronic circuit

design technique which aims to increase the controllability

and observability of a digital logic circuit by

incorporating special "scan registers" into the circuit so

that they form a scan path.

Some of the more common types of scan design include the

multiplexed register designs and level-sensitive scandesign (LSSD) used extensively by IBM. Boundary scan can

be used alone or in combination with either of the above

techniques.

["Digital Systems Testing and Testable Design" by Abramovici,

Breuer, and Friedman, ISBN 0-7167-8179-4].

["Design of Testable Logic Circuits" by R.G. Bennetts,

(Brunel/Southhampton Universities), ISBN 0-201-14403-4].

(1995-02-23)